- thin-film X-ray diffraction
- Аналитическая химия: рентгеноструктурный анализ тонких плёнок
Универсальный англо-русский словарь. Академик.ру. 2011.
thin-film X-ray diffraction
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Diffraction topography — (short: topography ) is an X ray imaging technique based on Bragg diffraction. Diffraction topographic images ( topographs ) record the intensity profile of a beam of X rays (or, sometimes, neutrons) diffracted by a crystal. A topograph thus… … Wikipedia
Diffraction grating — A very large reflecting diffraction grating. In optics, a diffraction grating is an optical component with a periodic structure, which splits and diffracts light into several beams travelling in different directions. The directions of these beams … Wikipedia
Ray tracing (physics) — In physics, ray tracing is a method for calculating the path of waves or particles through a system with regions of varying propagation velocity, absorption characteristics, and reflecting surfaces. Under these circumstances, wavefronts may bend … Wikipedia
Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… … Wikipedia
X-ray crystallography — can locate every atom in a zeolite, an aluminosilicate with many important applications, such as water purification. X ray crystallography is a method of determining the arrangement of atoms within a crystal, in which a beam of X rays strikes a… … Wikipedia
X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann … Wikipedia
X-ray scattering techniques — are a family of non destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered… … Wikipedia
Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… … Wikipedia
Grazing-incidence small-angle X-ray scattering — (GISAXS) is a scattering technique most commonly done at synchrotron radiation facilities. A related technique also exists for neutron scattering (GISANS). 300px|thumb|right|Scheme 1: GISAXS scattering geometry. The incident beam strikes the… … Wikipedia
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
X-ray microscope — An X ray microscope uses electromagnetic radiation in the soft X ray band to produce images of very small objects. Unlike visible light microscopes, X rays do not reflect or refract easily, and they are invisible to the human eye. Therefore the… … Wikipedia
